Symmetry’s superior sensitivity permits fast and effective analyses, even at accelerating voltages below 5 kV. This makes it the ideal detector when spatial resolution is a key factor, when mapping heavily deformed structures or when analysing beam-sensitive samples that preclude the use of higher beam energies.

9 a
9 b

Pattern quality map and corresponding IPF orientation map of a martensitic steel sample, analysed at 500 pps using a 12 kV accelerating voltage and with a measurement step size of 30 nm